The printable version is no longer supported and may have rendering errors. Please update your browser bookmarks and please use the default browser print function instead.

OOPS! (OntOlogy Pitfall Scanner!)

OOPS! is an ontology evaluation tool developed by the Ontology Engineering Group (OEG) at the Polytechnic University of Madrid, Spain (UPM, ES) that helps a developer detect some of the most common pitfalls appearing when developing ontologies.

Home page: http://www.oeg-upm.net/oops

Information about RESTFul Web Service: http://oops-ws.oeg-upm.net/

Reference:

http://2012.eswc-conferences.org/sites/default/files/eswc2012_submission_322.pdf
presentation by Ms. MariaPovedaVillalon (Universidad Politécnica de Madrid), Dr. MariCarmenSuarezFigueroa (Universidad Politécnica de Madrid) and Dr. AsuncionGomezPerez (Universidad Politécnica de Madrid) - "A Pitfall Catalogue and OOPS!: An Approach to Ontology Validation" - given at the Ontology Summit 2013 on 2013.01.31 - http://ontolog.cim3.net/cgi-bin/wiki.pl?ConferenceCall_2013_01_31#nid3L73

Ontolog Forum

OOPS! (OntOlogy Pitfall Scanner!)